Invention Grant
US08237476B2 Semiconductor memory device having delay lock loop with wide frequency range and delay cell current reduction scheme
有权
半导体存储器件具有宽频率范围的延迟锁定环和延迟单元电流降低方案
- Patent Title: Semiconductor memory device having delay lock loop with wide frequency range and delay cell current reduction scheme
- Patent Title (中): 半导体存储器件具有宽频率范围的延迟锁定环和延迟单元电流降低方案
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Application No.: US12878080Application Date: 2010-09-09
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Publication No.: US08237476B2Publication Date: 2012-08-07
- Inventor: Jun-bae Kim , Chang-hyun Bae
- Applicant: Jun-bae Kim , Chang-hyun Bae
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2009-0100766 20091022
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
A semiconductor memory device includes a delay lock loop (DLL) performing a locking operation at a wide frequency range and reducing current consumption. The semiconductor memory device includes a (DLL) having serially connected delay cells that receive and delay an external clock signal, wherein a predetermined number of delay cells of the serially connected delay cells that are to perform a delay operation are turned on in response to a threshold frequency recognition signal and first and second delay cell on signals, and for generating an internal clock signal; and a controller for generating the threshold frequency recognition signal and the first and second delay cell on signals, which reduce current consumption of each of the serially connected delay cells and increase a period of delay time thereof, if more delay cells are to be turned on when a delay cell indicating a threshold frequency is turned on.
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