Invention Grant
- Patent Title: Method of producing gas barrier film
- Patent Title (中): 阻气膜的制造方法
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Application No.: US12553476Application Date: 2009-09-03
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Publication No.: US08236388B2Publication Date: 2012-08-07
- Inventor: Tatsuya Fujinami , Toshiya Takahashi
- Applicant: Tatsuya Fujinami , Toshiya Takahashi
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2008-229581 20080908
- Main IPC: H05H1/24
- IPC: H05H1/24

Abstract:
A method of producing a gas barrier film comprises the steps of: supplying a material gas including silane gas, ammonia gas and at least one of nitrogen gas and hydrogen gas to a process chamber; keeping the process chamber at an internal pressure of 20 to 200 Pa; holding a substrate in the process chamber at a substrate temperature of not more than 70° C.; forming a bias potential of −100 V or less at the substrate; and supplying power P (W) to the material gas so as to have a ratio P/Q of the power P to a silane gas flow rate Q (sccm) of 15 to 30 W/sccm to generate plasma, thereby depositing a silicon nitride layer on a surface of the substrate.
Public/Granted literature
- US20100062183A1 METHOD OF PRODUCING GAS BARRIER FILM Public/Granted day:2010-03-11
Information query
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