Invention Grant
- Patent Title: Measuring device for a lancet-integrated sensor
- Patent Title (中): 柳叶刀集成传感器测量装置
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Application No.: US12267161Application Date: 2008-11-07
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Publication No.: US08235914B2Publication Date: 2012-08-07
- Inventor: Shinichi Kojima , Yoshinobu Tokuno
- Applicant: Shinichi Kojima , Yoshinobu Tokuno
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2001-11275 20010119
- Main IPC: A61B5/00
- IPC: A61B5/00 ; A61B17/14 ; A61B17/32 ; B65D81/00
Abstract:
A sensor and a lancet are integrated with each other. A thin strip-shaped sensor and a lancet are integrated so that the lancet moves in parallel, along a longitudinal direction of the sensor. A measuring device to which an integrated lancet and sensor is attached is provided with a function of driving the attached lancet.
Public/Granted literature
- US20090069719A1 LANCET-INTEGRATED SENSOR, MEASURING DEVICE FOR LANCET-INTEGRATED SENSOR, AND CARTRIDGE Public/Granted day:2009-03-12
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