Invention Grant
US08196078B2 Method for predicting and debugging EMI characteristics in IC system and related machine-readable medium
有权
IC系统及相关机器可读介质中EMI特性的预测和调试方法
- Patent Title: Method for predicting and debugging EMI characteristics in IC system and related machine-readable medium
- Patent Title (中): IC系统及相关机器可读介质中EMI特性的预测和调试方法
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Application No.: US12703770Application Date: 2010-02-11
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Publication No.: US08196078B2Publication Date: 2012-06-05
- Inventor: Tung-Yang Chen , Ching-Ling Tsai , Sheng-Fan Yang , Jui-Ni Lee
- Applicant: Tung-Yang Chen , Ching-Ling Tsai , Sheng-Fan Yang , Jui-Ni Lee
- Applicant Address: TW Fonghua Village, Xinshi Dist., Tainan
- Assignee: Himax Technologies Limited
- Current Assignee: Himax Technologies Limited
- Current Assignee Address: TW Fonghua Village, Xinshi Dist., Tainan
- Agent Winston Hsu; Scott Margo
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F11/22

Abstract:
A method for predicting and debugging electromagnetic interference (EMI) characteristics of an integrated circuit (IC) system includes the following steps: selecting a frequency domain range according to transformed raw data of the IC system to generate a blocking frequency analysis result, wherein the transformed raw data are transformed by a time-frequency waveform transformation; setting criteria data; comparing the blocking frequency analysis result with the criteria data to generate at least one comparison result; and generating a pass analysis report when a processing unit determines that each comparison result is passed; otherwise, executing an EMI design time-frequency analysis.
Public/Granted literature
- US20100235798A1 METHOD FOR PREDICTING AND DEBUGGING EMI CHARACTERISTICS IN IC SYSTEM AND RELATED MACHINE-READABLE MEDIUM Public/Granted day:2010-09-16
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