Invention Grant
US08196078B2 Method for predicting and debugging EMI characteristics in IC system and related machine-readable medium 有权
IC系统及相关机器可读介质中EMI特性的预测和调试方法

Method for predicting and debugging EMI characteristics in IC system and related machine-readable medium
Abstract:
A method for predicting and debugging electromagnetic interference (EMI) characteristics of an integrated circuit (IC) system includes the following steps: selecting a frequency domain range according to transformed raw data of the IC system to generate a blocking frequency analysis result, wherein the transformed raw data are transformed by a time-frequency waveform transformation; setting criteria data; comparing the blocking frequency analysis result with the criteria data to generate at least one comparison result; and generating a pass analysis report when a processing unit determines that each comparison result is passed; otherwise, executing an EMI design time-frequency analysis.
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