Invention Grant
- Patent Title: Detecting memory leaks
- Patent Title (中): 检测内存泄漏
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Application No.: US12147139Application Date: 2008-06-26
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Publication No.: US08195720B2Publication Date: 2012-06-05
- Inventor: Jinwoo Hwang
- Applicant: Jinwoo Hwang
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cuenot, Forsythe & Kim, LLC
- Main IPC: G06F12/00
- IPC: G06F12/00
Abstract:
Methods of detecting a memory leak may include identifying a largest ChildNode of a ParentNode, and comparing a total size of the ParentNode to a total size of the largest ChildNode of the ParentNode. If the total size of the ParentNode is significantly larger than the total size of the largest ChildNode of the ParentNode, a possible memory leak area may be identified. Related systems and computer program products are also discussed.
Public/Granted literature
- US20080320449A1 DETECTING MEMORY LEAKS Public/Granted day:2008-12-25
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