Invention Grant
- Patent Title: Fundamental wave beat component detecting method and measuring target signal sampling apparatus and waveform observation system using the same
- Patent Title (中): 基波分量检测方法和测量目标信号采样装置及使用其的波形观测系统
-
Application No.: US12308263Application Date: 2008-04-04
-
Publication No.: US08195416B2Publication Date: 2012-06-05
- Inventor: Yukio Tsuda
- Applicant: Yukio Tsuda
- Applicant Address: JP Atsugi-Shi
- Assignee: Anritsu Corporation
- Current Assignee: Anritsu Corporation
- Current Assignee Address: JP Atsugi-Shi
- Agency: Holtz, Holtz, Goodman & Chick., PC
- International Application: PCT/JP2008/056809 WO 20080404
- International Announcement: WO2009/122594 WO 20091008
- Main IPC: G01R23/16
- IPC: G01R23/16 ; G01R23/00 ; H04B15/00 ; G10L19/14

Abstract:
Frequencies of plural peak signals which appear in a band ½ of a sampling frequency are detected from a spectrum obtained from a measuring target signal sampled with the sampling frequency in order to detect the repetition frequency of the measuring target signal having plural harmonic components with a similar power. Each of the plural peak signals is successively assumed to be a fundamental wave beat component originating from the fundamental wave of the measuring target signal and theoretical frequencies of harmonic beat components originating from harmonic components of the measuring target signal are successively calculated. The theoretical frequencies are compared with the frequencies of the plural peak signals to determine one of the plural peak signals as a fundamental wave beat component originating from the fundamental wave of the measuring target signal.
Public/Granted literature
Information query