Invention Grant
- Patent Title: Method and apparatus for visual inspection
- Patent Title (中): 目视检查方法和装置
-
Application No.: US12751723Application Date: 2010-03-31
-
Publication No.: US08194969B2Publication Date: 2012-06-05
- Inventor: Kei Shimura
- Applicant: Kei Shimura
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2003-343090 20031001
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A visual inspection apparatus includes an image-data acquisition unit for acquiring plural pieces of image data A to C on an inspection target, image comparison units for comparing the image data A to C with each other thereby to create plural pieces of sign-affixed difference-image data D and E, the image data A to C being acquired by the image-data acquisition unit, difference-image comparison units for determining the difference between the sign-affixed difference-image data D and E created by the image comparison units, and a judgment unit for subjecting, to a threshold-value processing, difference data F between the difference-image data D and E, the difference data F being acquired by the difference-image comparison units, obtaining a detection sensitivity by enlarging the difference between an abnormal signal level of an image of an area where an abnormality exists from the visual inspection.
Public/Granted literature
- US20100239156A1 METHOD AND APPARATUS FOR VISUAL INSPECTION Public/Granted day:2010-09-23
Information query