Invention Grant
- Patent Title: Optimal weights for measuring spectral x-ray data
- Patent Title (中): 用于测量光谱X射线数据的最佳权重
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Application No.: US12700558Application Date: 2010-02-04
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Publication No.: US08194820B2Publication Date: 2012-06-05
- Inventor: Adam S. Wang , Norbert J. Pelc
- Applicant: Adam S. Wang , Norbert J. Pelc
- Applicant Address: US CA Palo Alto
- Assignee: The Board of Trustees of the Leland Stanford Junior University
- Current Assignee: The Board of Trustees of the Leland Stanford Junior University
- Current Assignee Address: US CA Palo Alto
- Agency: Beyer Law Group LLP
- Main IPC: G01N23/06
- IPC: G01N23/06 ; H05G1/64

Abstract:
A method for determining a composition of an object using a spectral x-ray system is provided. X-ray photons of at least two different energies are transmitted through the object. The energy of each detected x-ray photon using a detector in the x-ray system is estimated. A first weighted sum of the number of detected photons of each energy is found using a first weighting function, wherein the first weighting function is dependent on the attenuation coefficient function of a first material. In another embodiment, the photons are binned into two energy bins wherein there is a gap between the energy bins.
Public/Granted literature
- US20100202584A1 OPTIMAL WEIGHTS FOR MEASURING SPECTRAL X-RAY DATA Public/Granted day:2010-08-12
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