Invention Grant
- Patent Title: Semiconductor memory device and method for operating the same
- Patent Title (中): 半导体存储器件及其操作方法
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Application No.: US13113612Application Date: 2011-05-23
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Publication No.: US08194476B2Publication Date: 2012-06-05
- Inventor: Khil-Ohk Kang
- Applicant: Khil-Ohk Kang
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2007-0138583 20071227
- Main IPC: G11C5/14
- IPC: G11C5/14

Abstract:
A semiconductor memory device includes a voltage detector configured to detect a level of an external power supply voltage and an internal voltage generator configured to generate an internal voltage in response to an active signal and drive an internal voltage terminal with a driving ability corresponding to an output signal of the voltage detector. A method for operating the semiconductor memory device includes detecting a level of an external power supply voltage, based on a first target level, to output a detection signal; and generating an internal voltage in response to an active signal, and driving an internal voltage terminal with a driving ability corresponding to the detection signal.
Public/Granted literature
- US20110221411A1 SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR OPERATING THE SAME Public/Granted day:2011-09-15
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