Invention Grant
- Patent Title: Test circuit and method for an electronic device
- Patent Title (中): 电子设备的测试电路和方法
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Application No.: US12455075Application Date: 2009-05-28
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Publication No.: US08193825B2Publication Date: 2012-06-05
- Inventor: Wei Guo , Sha Feng
- Applicant: Wei Guo , Sha Feng
- Applicant Address: TW Miaoli County
- Assignee: Chimei Innolux Corporation
- Current Assignee: Chimei Innolux Corporation
- Current Assignee Address: TW Miaoli County
- Agency: Bacon & Thomas, PLLC
- Priority: TW97120033A 20080530
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R31/02

Abstract:
A test circuit for an electronic device including a liquid crystal display (LCD) device. The LCD device includes a pulse width modulator (PWM) to provide voltages to a display panel of the LCD device, a plurality of feedback circuits to output feedback voltages to the PWM, and a power supply to provide an operating voltage for the PWM. When the electronic device is in a test mode, the feedback circuits respectively decrease the feedback voltages, such that the PWM increases the voltages output to the display panel according to the feedback voltages, the increased voltages reach predetermined test voltages and test the electronic device.
Public/Granted literature
- US20090295424A1 Test circuit and method for an electronic device Public/Granted day:2009-12-03
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