Invention Grant
- Patent Title: Photodiode self-test
- Patent Title (中): 光电二极管自检
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Application No.: US12665871Application Date: 2008-05-27
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Publication No.: US08193815B2Publication Date: 2012-06-05
- Inventor: Gordian Prescher , Thomas Frach
- Applicant: Gordian Prescher , Thomas Frach
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- International Application: PCT/IB2008/052083 WO 20080527
- International Announcement: WO2009/001237 WO 20081231
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
A photodetector array (142) includes a plurality of photodetector cells (202) such as avalanche photodiodes (208) and readout circuits (210). An array self-tester (226) tests a dark count or other performance characteristic of the cells (202). The test is performed in connection with the manufacture of the array (142) or following the installation of the array (142) in a detection system (100).
Public/Granted literature
- US20100182011A1 PHOTODIODE SELF-TEST Public/Granted day:2010-07-22
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