Invention Grant
- Patent Title: Method for forming silicon trench
- Patent Title (中): 硅沟沟形成方法
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Application No.: US13026164Application Date: 2011-02-11
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Publication No.: US08193095B2Publication Date: 2012-06-05
- Inventor: Ching-Fuh Lin , Shih-Che Hung , Shu-Jia Syu
- Applicant: Ching-Fuh Lin , Shih-Che Hung , Shu-Jia Syu
- Applicant Address: TW Taipei
- Assignee: National Taiwan University
- Current Assignee: National Taiwan University
- Current Assignee Address: TW Taipei
- Agency: Stout, Uxa, Buyan & Mullins, LLP
- Priority: TW99134859A 20101013
- Main IPC: H01L21/311
- IPC: H01L21/311

Abstract:
A method for forming a silicon trench, comprises the steps of: defining an etching area at a silicon substrate; forming metal catalysts at the surface of the etching area; immersing the silicon substrate in a first etching solution thereby forming anisotropic silicon nanostructures in the etching area; immersing the silicon substrate in a second etching solution thereby resulting in the silicon nanostructures being side-etched and detached from the silicon substrate, thus forming the silicon trench.
Public/Granted literature
- US20110294255A1 METHOD FOR FORMING SILICON TRENCH Public/Granted day:2011-12-01
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