Invention Grant
- Patent Title: Method of manufacturing SOI substrate
- Patent Title (中): 制造SOI衬底的方法
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Application No.: US13019626Application Date: 2011-02-02
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Publication No.: US08193068B2Publication Date: 2012-06-05
- Inventor: Shunpei Yamazaki , Eiji Higa , Yoji Nagano , Tatsuya Mizoi , Akihisa Shimomura
- Applicant: Shunpei Yamazaki , Eiji Higa , Yoji Nagano , Tatsuya Mizoi , Akihisa Shimomura
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2007-112140 20070420
- Main IPC: H01L21/76
- IPC: H01L21/76

Abstract:
To provide an SOI substrate with an SOI layer that can be put into practical use, even when a substrate with a low allowable temperature limit such as a glass substrate is used, and to provide a semiconductor substrate formed using such an SOI substrate. In order to bond a single-crystalline semiconductor substrate to a base substrate such as a glass substrate, a silicon oxide film formed by CVD with organic silane as a source material is used as a bonding layer, for example. Accordingly, an SOL substrate with a strong bond portion can be formed even when a substrate with an allowable temperature limit of less than or equal to 700° C. such as a glass substrate is used. A semiconductor layer separated from the single-crystalline semiconductor substrate is irradiated with a laser beam so that the surface of the semiconductor layer is planarized and the crystallinity thereof is recovered.
Public/Granted literature
- US20110136320A1 METHOD OF MANUFACTURING SOI SUBSTRATE Public/Granted day:2011-06-09
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