Invention Grant
US08193054B2 Ultrahigh density vertical NAND memory device and method of making thereof
有权
超高密度垂直NAND存储器件及其制造方法
- Patent Title: Ultrahigh density vertical NAND memory device and method of making thereof
- Patent Title (中): 超高密度垂直NAND存储器件及其制造方法
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Application No.: US12827869Application Date: 2010-06-30
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Publication No.: US08193054B2Publication Date: 2012-06-05
- Inventor: Johann Alsmeier
- Applicant: Johann Alsmeier
- Applicant Address: US TX Plano
- Assignee: SanDisk Technologies, Inc.
- Current Assignee: SanDisk Technologies, Inc.
- Current Assignee Address: US TX Plano
- Agency: The Marbury Law Group, PLLC
- Main IPC: H01L21/8238
- IPC: H01L21/8238

Abstract:
A method of making a monolithic three dimensional NAND string, includes forming a stack of alternating layers of a first material and a second material different from the first material over a substrate, etching the stack to form at least one opening in the stack, forming a discrete charge storage material layer on a sidewall, forming a tunnel dielectric layer, forming a semiconductor channel material, selectively removing the second material layers without removing the first material layers, etching the discrete charge storage material layer to form a plurality of separate discrete charge storage segments, depositing an insulating material between the first material layers, selectively removing the first material layers to expose side wall of the discrete charge storage segments, forming a blocking dielectric, and forming control gates on the blocking dielectric.
Public/Granted literature
- US20120001250A1 ULTRAHIGH DENSITY VERTICAL NAND MEMORY DEVICE AND METHOD OF MAKING THEREOF Public/Granted day:2012-01-05
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