Invention Grant
- Patent Title: Battery, examination method and manufacturing method for negative electrode thereof, and examination apparatus and manufacturing apparatus for negative electrode thereof
- Patent Title (中): 电池，其负极的检查方法和制造方法及其负极的检查装置及其制造装置
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Application No.: US12024790Application Date: 2008-02-01
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Publication No.: US08192864B2Publication Date: 2012-06-05
- Inventor: Hideharu Takezawa , Takayuki Shirane , Shinya Fujimura , Sadayuki Okazaki , Kazuyoshi Honda
- Applicant: Hideharu Takezawa , Takayuki Shirane , Shinya Fujimura , Sadayuki Okazaki , Kazuyoshi Honda
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2007-022695 20070201
- Main IPC: H01M4/02
- IPC: H01M4/02
Abstract:
In a method for examining a negative electrode of a battery, a total thickness of a current collector and an active material layer is measured. Then, in order to estimate a composition of the active material layer, the total resistivity of the current collector and the active material layer is measured.
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