Invention Grant
- Patent Title: Apparatus for inspecting defects of honeycomb structure
- Patent Title (中): 检测蜂窝结构缺陷的装置
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Application No.: US12403599Application Date: 2009-03-13
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Publication No.: US08174689B2Publication Date: 2012-05-08
- Inventor: Takayoshi Akao , Hiroyuki Shindo , Jun Inoue , Keita Oikawa
- Applicant: Takayoshi Akao , Hiroyuki Shindo , Jun Inoue , Keita Oikawa
- Applicant Address: JP Nagoya
- Assignee: NGK Insulators, Ltd.
- Current Assignee: NGK Insulators, Ltd.
- Current Assignee Address: JP Nagoya
- Agency: Burr & Brown
- Priority: JP2008-073017 20080321; JP2009-058746 20090311
- Main IPC: B01D46/00
- IPC: B01D46/00 ; G01N21/00
Abstract:
According to an apparatus for inspecting defects of a honeycomb structure that is provided with a current plate and an air current formation means (air source and a header tube), fine defects or defects taking place in the vicinity of an outer periphery of the honeycomb structure can be detected with high sensitivity.
Public/Granted literature
- US20090237652A1 APPARATUS FOR INSPECTING DEFECTS OF HONEYCOMB STRUCTURE Public/Granted day:2009-09-24
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