Invention Grant
- Patent Title: Detection device and method for manufacturing the same
- Patent Title (中): 检测装置及其制造方法
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Application No.: US12651633Application Date: 2010-01-04
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Publication No.: US08174118B2Publication Date: 2012-05-08
- Inventor: Youichi Nagai , Hiroshi Inada
- Applicant: Youichi Nagai , Hiroshi Inada
- Applicant Address: JP Osaka-shi
- Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee Address: JP Osaka-shi
- Agency: Venable LLP
- Agent Michael A. Sartori; Leigh D. Thelen
- Priority: JP2009-000378 20090105
- Main IPC: H01L23/48
- IPC: H01L23/48

Abstract:
A method for manufacturing a detection device includes the steps of providing bonding bumps on at least one of a light-receiving element array and a read-out circuit multiplexer, fixing a bump height adjusting member for adjusting the heights of the bumps to the light-receiving element array and/or the read-out circuit multiplexer on which the bumps are provided, and pressing a flat plate on the tops of the bumps and deforming the bumps until the flat plate comes in contact with the end of the bump height adjusting member.
Public/Granted literature
- US20100171097A1 DETECTION DEVICE AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2010-07-08
Information query
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