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US08174103B2 Enhanced architectural interconnect options enabled with flipped die on a multi-chip package 失效
增强的架构互连选项在多芯片封装上支持翻转裸片

Enhanced architectural interconnect options enabled with flipped die on a multi-chip package
Abstract:
A particular chip is designed having a first variant (front side connected chip) of the chip and a second variant (back side connected chip). The first variant of the chip is attached to a carrier. The second variant of the chip is attached to the carrier inverted relative to the first variant of the chip. The first and second variants of the chip are attached to the carrier such that a vertical surface (side) of the first variant of the chip faces a corresponding vertical surface of the second variant of the chip. A circuit on the first variant of the chip is electrically connected to a corresponding circuit on the second variant of the chip.
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