Invention Grant
- Patent Title: Program evaluation program, program evaluation device, and program evaluation method
- Patent Title (中): 方案评价方案,方案评价装置和方案评价方法
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Application No.: US12020848Application Date: 2008-01-28
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Publication No.: US08171496B2Publication Date: 2012-05-01
- Inventor: Yutaka Tamiya
- Applicant: Yutaka Tamiya
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2007-18052 20070129
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F9/45

Abstract:
According to an aspect of an embodiment, an evaluation device for evaluating a target program is provided by calculating a first parameter showing an impact size of a target module of the target program on the outside of the target module, based on an execution log of the target program and calculating a second parameter that is a value related to a power consumption by executing the target module. An evaluator evaluates the target module based on the first and second parameters and outputs an evaluation result.
Public/Granted literature
- US20080184263A1 PROGRAM EVALUATION PROGRAM, PROGRAM EVALUATION DEVICE, AND PROGRAM EVALUATION METHOD Public/Granted day:2008-07-31
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