Invention Grant
- Patent Title: String pattern analysis
- Patent Title (中): 字符串模式分析
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Application No.: US12351527Application Date: 2009-01-09
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Publication No.: US08171039B2Publication Date: 2012-05-01
- Inventor: Andreas Arning , Roland Seiffert
- Applicant: Andreas Arning , Roland Seiffert
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Van Cott, Bagley, Cornwall & McCarthy PC
- Agent Steven L. Nichols
- Priority: EP08100342 20080111
- Main IPC: G06F7/00
- IPC: G06F7/00 ; G06F17/30

Abstract:
A method of analyzing a string-pattern includes defining a minimum length (Lmin—1) of substrings (STR_A_B) to be considered; defining a maximum length (Lmax—1) of substrings (STR_A_B) to be considered; with a computer, searching the string-pattern for substrings (STR_A_B) with a length in an interval between the minimum length (Lmin—1) and the maximum length (Lmax—1); counting an occurrence (Occ_A_B) of each substring (STR_A_B) found with a length in the interval between the minimum length (Lmin—1) and the maximum length (Lmax—1); and pruning away a number of the substrings (STR_A_B) that meet one or more criteria. The criteria are selected from the group consisting of (1) being contained inside the maximum substring (STR_A_C) in a subset (SET_A) of substrings (STR_A_B), (2) being shorter than the maximum substring (STR_A_C), (3) occurring with a same frequency as the maximum substring (STR_A_C), and combinations thereof.
Public/Granted literature
- US20090182744A1 STRING PATTERN ANALYSIS Public/Granted day:2009-07-16
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