Invention Grant
- Patent Title: Adaptive match metric selection for automatic target recognition
- Patent Title (中): 自适应匹配度量选择用于自动目标识别
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Application No.: US12214833Application Date: 2008-06-23
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Publication No.: US08170279B2Publication Date: 2012-05-01
- Inventor: Albert Ezekiel , Brent McCleary
- Applicant: Albert Ezekiel , Brent McCleary
- Applicant Address: US MA Waltham
- Assignee: Raytheon Company
- Current Assignee: Raytheon Company
- Current Assignee Address: US MA Waltham
- Agency: Christie, Parker & Hale, LLP
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
An automatic target recognition system with adaptive metric selection. The novel system includes an adaptive metric selector for selecting a match metric based on the presence or absence of a particular feature in an image and a matcher for identifying a target in the image using the selected match metric. In an illustrative embodiment, the adaptive metric selector is designed to detect a shadow in the image and select a first metric if a shadow is detected and not cut off, and select a second metric otherwise. The system may also include an automatic target cuer for detecting targets in a full-scene image and outputting one or more target chips, each chip containing one target. The adaptive metric selector adaptively selects the match metric for each chip separately, and may also adaptively select an appropriate chip size such that a shadow in the chip is not unnecessarily cut off.
Public/Granted literature
- US20090316953A1 Adaptive match metric selection for automatic target recognition Public/Granted day:2009-12-24
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