Invention Grant
US08169830B2 Sensing for all bit line architecture in a memory device 有权
检测存储器件中的所有位线架构

Sensing for all bit line architecture in a memory device
Abstract:
Methods for sensing, memory devices, and memory systems are disclosed. One such method for sensing includes charging bit lines of an all bit line architecture to a precharge voltage, selecting a word line, and performing a sense operation on the bit lines. After the sense operation on the memory cells of the first selected word line is complete, the precharge voltage is maintained on the bit lines while a second word line is selected.
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