Invention Grant
US08169823B2 Memory devices having volatile and non-volatile memory characteristics and methods of operating the same
有权
具有易失性和非易失性存储器特性的存储器件及其操作方法
- Patent Title: Memory devices having volatile and non-volatile memory characteristics and methods of operating the same
- Patent Title (中): 具有易失性和非易失性存储器特性的存储器件及其操作方法
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Application No.: US12458299Application Date: 2009-07-08
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Publication No.: US08169823B2Publication Date: 2012-05-01
- Inventor: Dong-II Bae
- Applicant: Dong-II Bae
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, PLC
- Priority: KR10-2008-0066261 20080708
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
Multi-bit semiconductor memory devices having both volatile and nonvolatile memory characteristics and methods of operating the same are disclosed, the semiconductor memory device including a floating body on an upper region of a substrate, a gate electrode on the floating body and electrically insulated from the floating body, source and drain regions on the substrate adjacent to the gate electrode and a charge trap layer between the floating body and the gate electrode, where first bit data is written in one of the charge trap layer and the floating body, and second bit data is written in one of the charge trap layer and the floating body in which first bit data is not written.
Public/Granted literature
- US20100008139A1 Memory devices having volatile and non-volatile memory characteristics and methods of operating the same Public/Granted day:2010-01-14
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