Invention Grant
- Patent Title: Exposure apparatus and method for producing device
- Patent Title (中): 曝光装置及其制造方法
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Application No.: US12153354Application Date: 2008-05-16
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Publication No.: US08169592B2Publication Date: 2012-05-01
- Inventor: Naoyuki Kobayashi , Akikazu Tanimoto , Yasushi Mizuno , Kenichi Shiraishi , Katsushi Nakano , Soichi Owa
- Applicant: Naoyuki Kobayashi , Akikazu Tanimoto , Yasushi Mizuno , Kenichi Shiraishi , Katsushi Nakano , Soichi Owa
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2003-146423 20030523; JP2003-305280 20030828; JP2004-049231 20040225
- Main IPC: G03B27/42
- IPC: G03B27/42 ; G03B27/52

Abstract:
An exposure apparatus includes an optical element via which a patterned beam is projected onto a substrate through exposure liquid filled in a space between the optical element and the substrate. The apparatus also includes a member having a surface and movable to a position at which the surface of the member faces the optical element. The apparatus also includes a cleaning system which cleans the surface of the member.
Public/Granted literature
- US20080225249A1 Exposure apparatus and method for producing device Public/Granted day:2008-09-18
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