Invention Grant
- Patent Title: Image sensor ADC and CDS per column with oversampling
- Patent Title (中): 图像传感器ADC和CDS每列具有过采样
-
Application No.: US11974813Application Date: 2007-10-16
-
Publication No.: US08169517B2Publication Date: 2012-05-01
- Inventor: Thomas Poonnen , Jeffrey J. Zarnowski , Li Liu , Michael Joyner , Ketan V. Karia
- Applicant: Thomas Poonnen , Jeffrey J. Zarnowski , Li Liu , Michael Joyner , Ketan V. Karia
- Applicant Address: US NY Homer
- Assignee: Panavision Imaging LLC
- Current Assignee: Panavision Imaging LLC
- Current Assignee Address: US NY Homer
- Agent Bernhard P Molldrem, Jr.
- Main IPC: H04N5/335
- IPC: H04N5/335 ; H04N3/14

Abstract:
A solid state imager converts analog pixel values to digital form on an arrayed per-column basis. An N-bit counter supplies an N-bit DAC to produce an analog ramp output with a level that varies corresponding to the contents of the counter. A latch/counter or equivalent is associated with each respective column. A clock supplies clock signal(s) to the counter elements. When the analog ramp equals the pixel value for that column, the latch/counter latches the value. The black level can be pre-set in the latch/counter or can be subtracted separately to reduce fixed pattern noise. The pixels can be oversampled for some number of times, e.g., n=16, to reduce the thermal noise of the sensors. Also, two or more pixels sharing a common sense node may be binned together, and two (or more) pixels having different integration times may be combined to obtain an output signal with enhanced dynamic range.
Public/Granted literature
- US20080043128A1 Image sensor ADC and CDS per Column with Oversampling Public/Granted day:2008-02-21
Information query