Invention Grant
- Patent Title: Programmable fine lock/unlock detection circuit
- Patent Title (中): 可编程精密锁/解锁检测电路
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Application No.: US12779637Application Date: 2010-05-13
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Publication No.: US08169242B2Publication Date: 2012-05-01
- Inventor: Saeed Abbasi , Raymond S P Tam , Nima Gilanpour
- Applicant: Saeed Abbasi , Raymond S P Tam , Nima Gilanpour
- Applicant Address: CA Markham, Ontario US CA Sunnyvale
- Assignee: ATI Technologies ULC,Advanced Micro Devices, Inc.
- Current Assignee: ATI Technologies ULC,Advanced Micro Devices, Inc.
- Current Assignee Address: CA Markham, Ontario US CA Sunnyvale
- Agency: Faegre Baker Daniels LLP
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
An integrated circuit includes a feedback controlled clock generating circuit, such as a DLL, PLL or other suitable circuit, that is operative to provide a feedback reference frequency signal based on a generated output clock signal. The integrated circuit also includes a programmable fine lock/unlock detection circuit that includes programmable static phase error sensitivity logic that senses phase error. The programmable static phase error sensitivity logic sets a phase lock sensitivity window used to determine a fine lock/unlock condition of the generated output clock signal. The programmable fine lock/unlock detection logic is also operative to generate a fine phase lock/unlock signal based on the set phase lock sensitivity window. The integrated circuit may also include a coarse lock detection circuit that generates a coarse lock signal based on a frequency unlock condition.
Public/Granted literature
- US20110279156A1 PROGRAMMABLE FINE LOCK/UNLOCK DETECTION CIRCUIT Public/Granted day:2011-11-17
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