Invention Grant
- Patent Title: Semiconductor device and method of manufacturing the same
- Patent Title (中): 半导体装置及其制造方法
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Application No.: US11785909Application Date: 2007-04-20
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Publication No.: US08169054B2Publication Date: 2012-05-01
- Inventor: Takahiro Oikawa
- Applicant: Takahiro Oikawa
- Applicant Address: JP Gunma US AZ Phoenix
- Assignee: SANYO Semiconductor Co., Ltd.,Semiconductor Components Industries, LLC
- Current Assignee: SANYO Semiconductor Co., Ltd.,Semiconductor Components Industries, LLC
- Current Assignee Address: JP Gunma US AZ Phoenix
- Agency: Morrison & Foerster LLP
- Priority: JP2006-117833 20060421; JP2007-081955 20070327
- Main IPC: H01L29/40
- IPC: H01L29/40

Abstract:
The invention is directed to a semiconductor device having a via hole and a method of manufacturing the same that achieve both the prevention of a barrier layer insufficiently covering the via hole and the control of via resistance at the same time. A semiconductor substrate having a pad electrode on its front surface is prepared. The semiconductor substrate is etched from its back surface to its front surface to form a via hole exposing the pad electrode. A first barrier layer is then formed in the via hole by a sputtering method or a PVD method and reverse-sputtering (etching). By this reverse-sputtering, the barrier layer on the bottom of the via hole is removed to expose the pad electrode. A second barrier layer is then formed on the pad electrode exposed in the via hole. The via resistance is controlled by adjusting only the thickness of the second barrier layer.
Public/Granted literature
- US20070249163A1 Semiconductor device and method of manufacturing the same Public/Granted day:2007-10-25
Information query
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