Invention Grant
- Patent Title: Semiconductor device and method of manufacturing the same
- Patent Title (中): 半导体装置及其制造方法
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Application No.: US12285275Application Date: 2008-10-01
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Publication No.: US08169017B2Publication Date: 2012-05-01
- Inventor: Taija Ema , Toru Anezaki
- Applicant: Taija Ema , Toru Anezaki
- Applicant Address: JP Yokohama
- Assignee: Fujitsu Semiconductor Limited
- Current Assignee: Fujitsu Semiconductor Limited
- Current Assignee Address: JP Yokohama
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2004-316974 20041029
- Main IPC: H01L29/788
- IPC: H01L29/788

Abstract:
A method of manufacturing a semiconductor device that comprises the steps of: removing a second insulating film on a contact region of a first conductor; forming a second conductive film on the second insulating film; removing the second conductive film on the contact region of the first conductor to make the second conductive film into a second conductor; forming an interlayer insulating film (a third insulating film) covering the second conductor; forming a first hole in the interlayer insulating film on the contact region; and forming a conductive plug, which is electrically connected with the contact region, in the first hole.
Public/Granted literature
- US20090045451A1 Semiconductor device and method of manufacturing the same Public/Granted day:2009-02-19
Information query
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