Invention Grant
- Patent Title: Method for simultaneous recrystallization and doping of semiconductor layers and semiconductor layer systems produced according to this method
- Patent Title (中): 根据该方法制造的半导体层和半导体层系统的同时重结晶和掺杂的方法
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Application No.: US12897900Application Date: 2010-10-05
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Publication No.: US08168972B2Publication Date: 2012-05-01
- Inventor: Stefan Reber
- Applicant: Stefan Reber
- Applicant Address: DE Munich
- Assignee: Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
- Current Assignee: Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
- Current Assignee Address: DE Munich
- Agency: Brinks Hofer Gilson & Lione
- Priority: DE102004044709 20040915
- Main IPC: H01L29/04
- IPC: H01L29/04

Abstract:
A method for simultaneous recrystallization and doping of semiconductor layers, in particular for the production of crystalline silicon thin layer solar cells. A substrate base layer 1 is produced, and subsequently, an intermediate layer system 2 which has at least one doped partial layer is deposited on the base layer. An absorber layer 3 which is undoped or likewise doped is deposited on the intermediate layer system 2, and in a recrystallisation step, the absorber layer 3 is heated, melted, cooled and tempered. Alternately, instead of an undoped capping layer, a capping layer system 4 which has at least one partial layer can also be applied on the absorber layer 3.
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