Invention Grant
US08168956B2 Scanning transmission electron microscope and method of aberration correction therefor 有权
扫描透射电子显微镜及其像差校正方法

  • Patent Title: Scanning transmission electron microscope and method of aberration correction therefor
  • Patent Title (中): 扫描透射电子显微镜及其像差校正方法
  • Application No.: US12400891
    Application Date: 2009-03-10
  • Publication No.: US08168956B2
    Publication Date: 2012-05-01
  • Inventor: Hidetaka Sawada
  • Applicant: Hidetaka Sawada
  • Applicant Address: JP Tokyo
  • Assignee: JEOL Ltd.
  • Current Assignee: JEOL Ltd.
  • Current Assignee Address: JP Tokyo
  • Agency: The Webb Law Firm
  • Priority: JP2008-60266 20080310
  • Main IPC: H01J37/153
  • IPC: H01J37/153 H01J37/08
Scanning transmission electron microscope and method of aberration correction therefor
Abstract:
A scanning transmission electron microscope (STEM) and method of aberration correction have autocorrelation function calculation means, aberration coefficient calculation means, and feedback control. At least two images are obtained by varying a value at which one of the electron optical means is set. The at least two images are autocorrelated. Iso-intensity lines are fit to aberration functions. Aberration coefficients are obtained based on aberration functions. The feedback controls the electron optical column.
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