Invention Grant
- Patent Title: Scanning transmission electron microscope and method of aberration correction therefor
- Patent Title (中): 扫描透射电子显微镜及其像差校正方法
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Application No.: US12400891Application Date: 2009-03-10
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Publication No.: US08168956B2Publication Date: 2012-05-01
- Inventor: Hidetaka Sawada
- Applicant: Hidetaka Sawada
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2008-60266 20080310
- Main IPC: H01J37/153
- IPC: H01J37/153 ; H01J37/08

Abstract:
A scanning transmission electron microscope (STEM) and method of aberration correction have autocorrelation function calculation means, aberration coefficient calculation means, and feedback control. At least two images are obtained by varying a value at which one of the electron optical means is set. The at least two images are autocorrelated. Iso-intensity lines are fit to aberration functions. Aberration coefficients are obtained based on aberration functions. The feedback controls the electron optical column.
Public/Granted literature
- US20090224169A1 Scanning Transmission Electron Microscope and Method of Aberration Correction Therefor Public/Granted day:2009-09-10
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