Invention Grant
US08168251B2 Method for producing tapered metallic nanowire tips on atomic force microscope cantilevers
失效
在原子力显微镜悬臂上生产锥形金属纳米线尖端的方法
- Patent Title: Method for producing tapered metallic nanowire tips on atomic force microscope cantilevers
- Patent Title (中): 在原子力显微镜悬臂上生产锥形金属纳米线尖端的方法
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Application No.: US12287721Application Date: 2008-10-10
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Publication No.: US08168251B2Publication Date: 2012-05-01
- Inventor: Friedrich B. Prinz , Neil Dasgupta , Munekazu Motoyama
- Applicant: Friedrich B. Prinz , Neil Dasgupta , Munekazu Motoyama
- Applicant Address: US CA Palo Alto JP Tokyo
- Assignee: The Board of Trustees of the Leland Stanford Junior University,Honda Motor Co., Ltd
- Current Assignee: The Board of Trustees of the Leland Stanford Junior University,Honda Motor Co., Ltd
- Current Assignee Address: US CA Palo Alto JP Tokyo
- Agency: Lumen Patent Firm
- Main IPC: B05D5/12
- IPC: B05D5/12
Abstract:
A method of making nanowire probes is provided. The method includes providing a template having a nanoporous structure, providing a probe tip that is disposed on top of the template, and growing nanowires on the probe tip, where the nanowires are grown from the probe tip along the nanopores, and the nanowires conform to the shape of the nanopores.
Public/Granted literature
- US20100089866A1 Method for producing tapered metallic nanowire tips on atomic force microscope cantilevers Public/Granted day:2010-04-15
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