Invention Grant
- Patent Title: Handling system for inspecting and sorting electronic components
- Patent Title (中): 电子元件检查和分类处理系统
-
Application No.: US11941372Application Date: 2007-11-16
-
Publication No.: US08167524B2Publication Date: 2012-05-01
- Inventor: Chi Wah Cheng , Wang Lung Alan Tse , Tim Wai Tony Mak , Lap Kei Eric Chow
- Applicant: Chi Wah Cheng , Wang Lung Alan Tse , Tim Wai Tony Mak , Lap Kei Eric Chow
- Applicant Address: HK Hong Kong
- Assignee: ASM Assembly Automation Ltd
- Current Assignee: ASM Assembly Automation Ltd
- Current Assignee Address: HK Hong Kong
- Agency: Ostrolenk Faber LLP
- Main IPC: B65H9/08
- IPC: B65H9/08

Abstract:
A semiconductor package handling system is provided comprising a package holder for receiving and holding singulated semiconductor packages, and a first inspection device which is arranged and configured to inspect a first surface of the packages while they are being held by the package holder. An offloading device receives the packages from the package holder and conveys them packages to an offloader, and a second inspection device is arranged and configured to inspect a second surface of the packages which is opposite from the first surface while they are being held by the offloading device.
Public/Granted literature
- US20090129899A1 HANDLING SYSTEM FOR INSPECTING AND SORTING ELECTRONIC COMPONENTS Public/Granted day:2009-05-21
Information query