Invention Grant
- Patent Title: Dot position measurement method, dot position measurement apparatus, and computer readable medium
- Patent Title (中): 点位置测量方法,点位置测量装置和计算机可读介质
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Application No.: US12569307Application Date: 2009-09-29
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Publication No.: US08167412B2Publication Date: 2012-05-01
- Inventor: Yoshirou Yamazaki
- Applicant: Yoshirou Yamazaki
- Applicant Address: JP Tokyo
- Assignee: Fujifilm Corporation
- Current Assignee: Fujifilm Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2008-253435 20080930
- Main IPC: B41J2/12
- IPC: B41J2/12 ; B41J29/393 ; B41J29/38

Abstract:
Dot positions are measured by recording dots on a recording medium in a measurement line pattern including a plurality of lines of rows of the dots respectively corresponding to a plurality of recording elements. The measurement line pattern is read where a longitudinal direction of the plurality of lines is directed to a sub-scanning direction of an image reading apparatus. A plurality of averaging regions is allocated to different positions of line blocks, the lines arranged in a main scanning direction. The image signal is averaged in the allocated averaging regions, and average profile images are created for positions in terms of the main scanning direction. Positions of both edges of each line are determined according to the average profile images. Line positions in the averaging regions are determined according to the edge positions. Line positions in the line blocks are determined according to the line positions in the averaging regions.
Public/Granted literature
- US20100079518A1 DOT POSITION MEASUREMENT METHOD, DOT POSITION MEASUREMENT APPARATUS, AND COMPUTER READABLE MEDIUM Public/Granted day:2010-04-01
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