Invention Grant
- Patent Title: Sensor chip and inspection device
- Patent Title (中): 传感器芯片和检测装置
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Application No.: US12076499Application Date: 2008-03-19
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Publication No.: US08166835B2Publication Date: 2012-05-01
- Inventor: Michiaki Murata
- Applicant: Michiaki Murata
- Applicant Address: JP Tokyo
- Assignee: Fuji Xerox Co., Ltd.
- Current Assignee: Fuji Xerox Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2007-104665 20070412
- Main IPC: G01M99/00
- IPC: G01M99/00
Abstract:
A sensor chip of an electrical signal detection type, comprises a semiconductor sensing device, the sensor chip being detachable with respect to an inspection device.
Public/Granted literature
- US20080250883A1 Sensor chip and inspection device Public/Granted day:2008-10-16
Information query
