Invention Grant
US08151125B1 System and method for providing multi-point calibration of an adaptive voltage scaling system
有权
用于提供自适应电压缩放系统的多点校准的系统和方法
- Patent Title: System and method for providing multi-point calibration of an adaptive voltage scaling system
- Patent Title (中): 用于提供自适应电压缩放系统的多点校准的系统和方法
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Application No.: US12462888Application Date: 2009-08-11
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Publication No.: US08151125B1Publication Date: 2012-04-03
- Inventor: Mark Hartman , James T. Doyle , Dragan Maksimovic , Pasi Salmi , Juha Pennanen , Sandeep Dhar
- Applicant: Mark Hartman , James T. Doyle , Dragan Maksimovic , Pasi Salmi , Juha Pennanen , Sandeep Dhar
- Applicant Address: US CA Santa Clara
- Assignee: National Semiconductor Corporation
- Current Assignee: National Semiconductor Corporation
- Current Assignee Address: US CA Santa Clara
- Main IPC: G06F1/26
- IPC: G06F1/26
Abstract:
A system and method is disclosed for providing multi-point calibration of an adaptive voltage scaling (AVS) system. A plurality of Reference Calibration Codes (RCCs) within a multi-point calibration table is provided. Each code is associated with one of the clock frequencies of the adaptive voltage scaling (AVS) system. The present invention provides multi-point calibration by calibrating a Reference Calibration Code (RCC) for each operating point (clock frequency) of the adaptive voltage scaling (AVS) system.
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