Invention Grant
- Patent Title: Quality improvement system
- Patent Title (中): 质量改进体系
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Application No.: US12046897Application Date: 2008-03-12
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Publication No.: US08150895B2Publication Date: 2012-04-03
- Inventor: Hiroyuki Mori , Yoshihiro Nagao , Yoshiaki Hiraoka
- Applicant: Hiroyuki Mori , Yoshihiro Nagao , Yoshiaki Hiraoka
- Applicant Address: JP Kyoto
- Assignee: Omron Corporation
- Current Assignee: Omron Corporation
- Current Assignee Address: JP Kyoto
- Agency: Foley & Lardner LLP
- Priority: JPP2007-065265 20070314
- Main IPC: G06F7/00
- IPC: G06F7/00

Abstract:
A quality improvement system using an FMEA table of the invention includes a defect data collecting unit to collect defect data about a defect in a manufacturing or inspection process and an FMEA table update unit to update the FMEA table online based on the data collected by the defect data collecting unit. The FMEA table includes a failure mode, the number of occurrences of the failure mode, and an effect caused by the failure mode. The FMEA table update unit includes an FMEA table editing unit to edit the FMEA table. The FMEA table editing unit edits the number of occurrences of the failure mode when a row including a set of an occurred failure mode and an effect corresponding to the occurred failure mode is previously defined in the FMEA table, and inserts the row into the FMEA table when the row is not defined in the FMEA table.
Public/Granted literature
- US20080228307A1 QUALITY IMPROVEMENT SYSTEM Public/Granted day:2008-09-18
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