Invention Grant
- Patent Title: Test apparatus of semiconductor integrated circuit and method using the same
- Patent Title (中): 半导体集成电路的测试装置及其使用方法
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Application No.: US12941874Application Date: 2010-11-08
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Publication No.: US08149639B2Publication Date: 2012-04-03
- Inventor: Jong-Sam Kim , Kwang-Jun Cho
- Applicant: Jong-Sam Kim , Kwang-Jun Cho
- Applicant Address: KR
- Assignee: Hynix Semiconductor, Inc.
- Current Assignee: Hynix Semiconductor, Inc.
- Current Assignee Address: KR
- Agency: Baker & McKenzie LLP
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C7/00
Abstract:
A test apparatus includes a test fuse unit for generating a test fuse signal in response to a test mode signal during a test time and generating a test fuse signals according to a fuse cutting after a termination of the test time, a combination signal generating unit for storing a test signal and inactivating a combination signal when the test mode signal is inactivate and for outputting the stored test signal as the combination signal when the test mode signal is activate, and a code signal generating unit for activating a test code signal when one of the test fuse signal and the combination signal is activated.
Public/Granted literature
- US20110050271A1 TEST APPARATUS OF SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD USING THE SAME Public/Granted day:2011-03-03
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