Invention Grant
US08149546B2 Magnetic field detecting element including tri-layer stack with stepped portion
有权
磁场检测元件包括具有阶梯部分的三层叠层
- Patent Title: Magnetic field detecting element including tri-layer stack with stepped portion
- Patent Title (中): 磁场检测元件包括具有阶梯部分的三层叠层
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Application No.: US11925030Application Date: 2007-10-26
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Publication No.: US08149546B2Publication Date: 2012-04-03
- Inventor: Toshiyuki Ayukawa , Daisuke Miyauchi , Koji Shimazawa , Takahiko Machita
- Applicant: Toshiyuki Ayukawa , Daisuke Miyauchi , Koji Shimazawa , Takahiko Machita
- Applicant Address: JP Tokyo
- Assignee: TDK Corporation
- Current Assignee: TDK Corporation
- Current Assignee Address: JP Tokyo
- Agency: Knobbe Martens Olson & Bear LLP
- Main IPC: G11B5/39
- IPC: G11B5/39

Abstract:
A magnetic field detecting element comprises a stack including upper and lower magnetic layers, and a non-magnetic intermediate layer sandwiched therebetween, wherein magnetization of the magnetic layers changes in accordance with an external magnetic field; upper and lower shield electrode layers sandwiching the stack in a direction of stacking, wherein the upper and lower shield electrode layers supply sense current in the direction of stacking, and magnetically shield the stack; a bias magnetic layer provided on a surface of the stack opposite to an air bearing surface, and wherein the bias magnetic layer applies a bias magnetic field to the upper and lower magnetic layers in a direction perpendicular to the air bearing surface; and insulating layers provided on both sides of the stack in a track width direction thereof, wherein the stack has a stepped portion formed at the non-magnetic intermediate layer.
Public/Granted literature
- US20090109580A1 MAGNETIC FIELD DETECTING ELEMENT INCLUDING TRI-LAYER STACK WITH STEPPED PORTION Public/Granted day:2009-04-30
Information query
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