Invention Grant
- Patent Title: Optical reflectometry and optical reflectometer
- Patent Title (中): 光学反射计和光学反射计
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Application No.: US12525287Application Date: 2008-02-21
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Publication No.: US08149419B2Publication Date: 2012-04-03
- Inventor: Xinyu Fan , Fumihiko Ito , Yusuke Koshikiya
- Applicant: Xinyu Fan , Fumihiko Ito , Yusuke Koshikiya
- Applicant Address: JP Tokyo
- Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee Address: JP Tokyo
- Agency: DLA Piper LLP (US)
- Priority: JP2007-050769 20070228; JP2007-282319 20071030
- International Application: PCT/JP2008/052991 WO 20080221
- International Announcement: WO2008/105322 WO 20080904
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01N21/55

Abstract:
An object of the invention is to provide an optical reflectometry and an optical reflectometer, in which accurate measurement can be performed irrespective of a measurement distance. In the optical reflectometry and optical reflectometer according to the invention, in which a distribution of backscattered light intensity from a measurement target in an optical propagation direction is measured using Optical Frequency Domain Reflectometry (OFDR), a coherence monitor unit 12 that monitors a coherence property of a frequency sweep light source 1 is provided, and measurement result of a measuring unit 11 is corrected based on the monitor result of the coherence monitor unit 12.
Public/Granted literature
- US20100097615A1 Optical Reflectometry and Optical Reflectometer Public/Granted day:2010-04-22
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