Invention Grant
US08149414B2 Method and device for measuring the spectral phase or the combined spectral and spatial phases of ultra short light pulses
有权
用于测量超短光脉冲的光谱相位或组合光谱和空间相位的方法和装置
- Patent Title: Method and device for measuring the spectral phase or the combined spectral and spatial phases of ultra short light pulses
- Patent Title (中): 用于测量超短光脉冲的光谱相位或组合光谱和空间相位的方法和装置
-
Application No.: US12345229Application Date: 2008-12-29
-
Publication No.: US08149414B2Publication Date: 2012-04-03
- Inventor: Daniel Kaplan , Thomas Oksenhendler , Nicolas Forget
- Applicant: Daniel Kaplan , Thomas Oksenhendler , Nicolas Forget
- Applicant Address: FR Paris
- Assignee: Fastlite
- Current Assignee: Fastlite
- Current Assignee Address: FR Paris
- Agency: Browdy and Neimark, PLLC
- Priority: FR0709092 20071226
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
The method and device for measuring the spectral phase or combined spectral and spatial phases of ultra short light pulses, consisting of a decomposition of the light pulse to be measured in two identical replicas called signal pulse and primary reference pulse, respectively, of different polarization or direction and the phase characteristics of which are essentially identical to the original pulse, a temporal filtering of the primary reference pulse by a nonlinear interaction generating a secondary reference pulse of average frequency essentially identical and of spectral width greater than the spectral width of the primary reference pulse, and a spectral interferometry measurement by recombination of this secondary reference pulse and the signal pulse with a given temporal offset.
Public/Granted literature
Information query