Invention Grant
US08148197B2 Methods of forming germanium-antimony-tellurium materials and a method of forming a semiconductor device structure including the same 有权
形成锗 - 锑 - 碲材料的方法和形成包括其的半导体器件结构的方法

  • Patent Title: Methods of forming germanium-antimony-tellurium materials and a method of forming a semiconductor device structure including the same
  • Patent Title (中): 形成锗 - 锑 - 碲材料的方法和形成包括其的半导体器件结构的方法
  • Application No.: US12844595
    Application Date: 2010-07-27
  • Publication No.: US08148197B2
    Publication Date: 2012-04-03
  • Inventor: Eugene P. Marsh
  • Applicant: Eugene P. Marsh
  • Applicant Address: US ID Boise
  • Assignee: Micron Technology, Inc.
  • Current Assignee: Micron Technology, Inc.
  • Current Assignee Address: US ID Boise
  • Agency: TraskBritt
  • Main IPC: H01L21/00
  • IPC: H01L21/00
Methods of forming germanium-antimony-tellurium materials and a method of forming a semiconductor device structure including the same
Abstract:
A method of forming a material. The method comprises conducting an ALD layer cycle of a first metal, the ALD layer cycle comprising a reactive first metal precursor and a co-reactive first metal precursor. An ALD layer cycle of a second metal is conducted, the ALD layer cycle comprising a reactive second metal precursor and a co-reactive second metal precursor. An ALD layer cycle of a third metal is conducted, the ALD layer cycle comprising a reactive third metal precursor and a co-reactive third metal precursor. The ALD layer cycles of the first metal, the second metal, and the third metal are repeated to form a material, such as a GeSbTe material, having a desired stoichiometry. Additional methods of forming a material, such as a GeSbTe material, are disclosed, as is a method of forming a semiconductor device structure including a GeSbTe material.
Information query
Patent Agency Ranking
0/0