Invention Grant
US08148197B2 Methods of forming germanium-antimony-tellurium materials and a method of forming a semiconductor device structure including the same
有权
形成锗 - 锑 - 碲材料的方法和形成包括其的半导体器件结构的方法
- Patent Title: Methods of forming germanium-antimony-tellurium materials and a method of forming a semiconductor device structure including the same
- Patent Title (中): 形成锗 - 锑 - 碲材料的方法和形成包括其的半导体器件结构的方法
-
Application No.: US12844595Application Date: 2010-07-27
-
Publication No.: US08148197B2Publication Date: 2012-04-03
- Inventor: Eugene P. Marsh
- Applicant: Eugene P. Marsh
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A method of forming a material. The method comprises conducting an ALD layer cycle of a first metal, the ALD layer cycle comprising a reactive first metal precursor and a co-reactive first metal precursor. An ALD layer cycle of a second metal is conducted, the ALD layer cycle comprising a reactive second metal precursor and a co-reactive second metal precursor. An ALD layer cycle of a third metal is conducted, the ALD layer cycle comprising a reactive third metal precursor and a co-reactive third metal precursor. The ALD layer cycles of the first metal, the second metal, and the third metal are repeated to form a material, such as a GeSbTe material, having a desired stoichiometry. Additional methods of forming a material, such as a GeSbTe material, are disclosed, as is a method of forming a semiconductor device structure including a GeSbTe material.
Public/Granted literature
Information query
IPC分类: