Invention Grant
- Patent Title: Sample measuring apparatus and sample measuring method
- Patent Title (中): 样品测量仪器和样品测量方法
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Application No.: US11729295Application Date: 2007-03-28
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Publication No.: US08147754B2Publication Date: 2012-04-03
- Inventor: Takaaki Nagai , Hideaki Matsumoto , Yuichi Hamada
- Applicant: Takaaki Nagai , Hideaki Matsumoto , Yuichi Hamada
- Applicant Address: JP Hyogo
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Hyogo
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2006-94947 20060330
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; G01N21/00 ; G01N33/48

Abstract:
A sample measuring apparatus of measuring a component in a biological sample, comprising: an input section for inputting a sample species of a biological sample; a measurement sample preparation section for preparing a measurement sample by mixing the biological sample with a reagent; a first measurement section; a second measurement section being different from the first measurement section; a measurement sample supply section for supplying the measurement sample prepared in the measurement sample preparation section to at least one of the first measurement section and second measurement section; and a control section for controlling the measurement sample supply section based on the inputted sample species.
Public/Granted literature
- US20070231206A1 Sample measuring apparatus and sample measuring method Public/Granted day:2007-10-04
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