Invention Grant
- Patent Title: X-ray tomography inspection systems
- Patent Title (中): X光断层扫描检查系统
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Application No.: US12142005Application Date: 2008-06-19
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Publication No.: US08135110B2Publication Date: 2012-03-13
- Inventor: Edward James Morton
- Applicant: Edward James Morton
- Applicant Address: US CA Hawthorne
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Hawthorne
- Agency: Novel IP
- Priority: GB0525593.0 20051216
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01N23/203
Abstract:
The present invention is an X-ray scanning system with an X-ray source arranged to generate X-rays from X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, a second set of detectors arranged to detect X-rays scattered within the scanning region, and a processor arranged to process outputs from the detectors to generate image data.
Public/Granted literature
- US20090060135A1 X-Ray Tomography Inspection Systems Public/Granted day:2009-03-05
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