Invention Grant
- Patent Title: Particulate detector system
- Patent Title (中): 颗粒检测系统
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Application No.: US12791426Application Date: 2010-06-01
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Publication No.: US08134710B2Publication Date: 2012-03-13
- Inventor: Keiichi Kajino , Mitsuharu Iwasaki , Tatsuyuki Nihei
- Applicant: Keiichi Kajino , Mitsuharu Iwasaki , Tatsuyuki Nihei
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent John J. Patti; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Priority: JP2009-132364 20090601
- Main IPC: G01N21/17
- IPC: G01N21/17 ; G01N21/53 ; G08B17/10

Abstract:
A particulate detector system is provided that can sense particulates (such as smoke in the air). The system employs a reflected light system that generally avoids making measurements of light intensity. Instead, coded signals are compared with one another to determine error rates between emitted light and detected light (across a chamber). Based on the error rate, processing circuitry can determine particulate concentration.
Public/Granted literature
- US20100302545A1 PARTICULATE DETECTOR SYSTEM Public/Granted day:2010-12-02
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