Invention Grant
US08134192B2 Integrated structure of MEMS device and CMOS image sensor device
有权
MEMS器件和CMOS图像传感器器件的集成结构
- Patent Title: Integrated structure of MEMS device and CMOS image sensor device
- Patent Title (中): MEMS器件和CMOS图像传感器器件的集成结构
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Application No.: US12888418Application Date: 2010-09-23
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Publication No.: US08134192B2Publication Date: 2012-03-13
- Inventor: Hui-Shen Shih
- Applicant: Hui-Shen Shih
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H01L31/062
- IPC: H01L31/062 ; H01L31/113 ; H01L29/82

Abstract:
An integrated structure of MEMS device and CIS device and a fabricating method thereof includes providing a substrate having a CIS region and a MEMS region defined therein with a plurality of CIS devices positioned in the CIS region; performing a multilevel interconnect process to form a multilevel interconnect structure in the CIS region and the MEMS region and a micro-machined mesh metal in the MEMS region on a front side of the substrate; performing a first etching process to form a chamber in MEMS region in the front side of the substrate; forming a first mask pattern and a second mask pattern respectively in the CIS region and the MEMS region on a back side of the substrate; and performing a second etching process to form a plurality of vent holes connecting to the chamber on the back side of the substrate through the second mask pattern.
Public/Granted literature
- US20110006350A1 INTEGRATED STRUCTURE OF MEMS DEVICE AND CMOS IMAGE SENSOR DEVICE Public/Granted day:2011-01-13
Information query
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