Invention Grant
- Patent Title: Reflectron
- Patent Title (中): 反光镜
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Application No.: US12425291Application Date: 2009-04-16
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Publication No.: US08134119B2Publication Date: 2012-03-13
- Inventor: Peter Panayi
- Applicant: Peter Panayi
- Applicant Address: US NJ Mahwah
- Assignee: Cameca Instruments, Inc.
- Current Assignee: Cameca Instruments, Inc.
- Current Assignee Address: US NJ Mahwah
- Agency: DeWitt Ross & Stevens S.C.
- Agent Craig A. Fieschko, Esq.
- Priority: GB0509638.3 20050511
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
A reflectron (1) for deflecting an ion from a specimen in a time-of-flight mass spectrometer comprises a front electrode (2) and a back electrode (3). At least one of the front and back electrodes (2, 3) is capable of generating a curved electric field. The front and back electrodes are configured to perform time focusing and resolve an image of a specimen.
Public/Granted literature
- US20100006752A1 REFLECTRON Public/Granted day:2010-01-14
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