Invention Grant
- Patent Title: Apparatus and method for the detection of forces in the sub-micronewton range
- Patent Title (中): 用于检测亚微米范围内的力的装置和方法
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Application No.: US12497364Application Date: 2009-07-02
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Publication No.: US08132268B2Publication Date: 2012-03-06
- Inventor: Thorsten Hugel , Michael Geisler
- Applicant: Thorsten Hugel , Michael Geisler
- Applicant Address: DE
- Assignee: Technische Universitaet Muenchen
- Current Assignee: Technische Universitaet Muenchen
- Current Assignee Address: DE
- Agency: St. Onge Steward Johnston & Reens LLC
- Priority: DE102007001797 20070105
- Main IPC: G01Q60/00
- IPC: G01Q60/00
Abstract:
A force microscope for the detection of forces in the sub-micronewton range has a measurement head which is used to carry out a relative movement with respect to a sample holder and to which a carrier molecule is attached on which probe molecules are placed.
Public/Granted literature
- US20100011472A1 Apparatus And Method For The Detection Of Forces In The Sub-Micronewton Range Public/Granted day:2010-01-14
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