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US08132064B2 Selectively accessing test access ports in a multiple test access port environment 有权
在多个测试访问端口环境中选择性访问测试访问端口

  • Patent Title: Selectively accessing test access ports in a multiple test access port environment
  • Patent Title (中): 在多个测试访问端口环境中选择性访问测试访问端口
  • Application No.: US13098776
    Application Date: 2011-05-02
  • Publication No.: US08132064B2
    Publication Date: 2012-03-06
  • Inventor: Lee D. Whetsel
  • Applicant: Lee D. Whetsel
  • Applicant Address: US TX Dallas
  • Assignee: Texas Instruments Incorporated
  • Current Assignee: Texas Instruments Incorporated
  • Current Assignee Address: US TX Dallas
  • Agent Lawrence J. Bassuk; W. James Brady; Frederick J. Telecky, Jr.
  • Main IPC: G01R31/28
  • IPC: G01R31/28
Selectively accessing test access ports in a multiple test access port environment
Abstract:
A TAP linking module (21, 51) permits plural TAPs (TAPs 1-4) to be controlled and accessed from a test bus (13) via a single TAP interface (20).
Abstract(Chinese):

TAP链接模块（21,51）允许通过单个TAP接口（20）从测试总线（13）控制和访问多个TAP（TAP 1-4）。

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