System and method for analyzing operation of a device under test (DUT). In one embodiment, a reference component associated with a reference device may be received. The reference device may be in communication with the DUT and a component associated with the DUT can be exchanged with the reference component. A test may be performed on the DUT, wherein a result of the test may correspond to a source of a fault associated with the DUT. An indication of the source of the fault may be provided based on the test result.