Invention Grant
- Patent Title: Testing and measurement in optical networks
- Patent Title (中): 光网络测试与测量
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Application No.: US12576933Application Date: 2009-10-09
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Publication No.: US08131151B2Publication Date: 2012-03-06
- Inventor: Paparao Palacharla
- Applicant: Paparao Palacharla
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Baker Botts L.L.P.
- Main IPC: H04J14/02
- IPC: H04J14/02

Abstract:
An optical node may include a plurality of optical input components operable to receive a plurality of signals communicated in an optical network and a plurality of optical output components operable to transmit a plurality of signals to be communicated in the optical network. The optical node may also include at least one of: (a) an optical drop component coupled to the plurality of optical input components, the optical drop component operable to select a signal and select a portion of the signal of a particular selectable wavelength to drop to an associated item of test equipment from any one of the plurality of optical input components; and (b) an optical add component coupled to the plurality of optical output components and operable to selectively transmit copies of a selected one or more of a plurality of optical add signals to the plurality of optical output components, wherein the plurality of optical add signals includes a signal of a particular selectable wavelength communicated to the optical add component from an associated item of test equipment, and wherein each optical output component is operable to select a signal to communicate in the optical network received from any one of the optical add component and the plurality of optical input components.
Public/Granted literature
- US20110085801A1 Testing and Measurement in Optical Networks Public/Granted day:2011-04-14
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